@conference {105,
	title = {A Physical-Statistical Approach to AlGaN/GaN HEMT Reliability},
	booktitle = {2019 IEEE International Reliability Physics Symposium (IRPS)2019 IEEE International Reliability Physics Symposium (IRPS)},
	year = {2019},
	publisher = {IEEE},
	organization = {IEEE},
	address = {Monterey, CA, USA},
	doi = {10.1109/IRPS.2019.8720521},
	author = {Moens, Peter and Stockman, Arno}
}
