We've updated publication list on our website, and reached a milestone! Feel curious to dive into more than 50 publications investigating Gallium Nitride power devices!
ESD-failure of E-mode GaN HEMTs: Role of device geometry and charge trapping
| Title | ESD-failure of E-mode GaN HEMTs: Role of device geometry and charge trapping |
| Publication Type | Journal Article |
| Year of Publication | 2019 |
| Authors | Canato E., Meneghini M., Nardo A., Masin F., Barbato A., Barbato M., Stockman A., Banerjee A., Moens P., Zanoni E., Meneghesso G. |
| Journal | Microelectronics Reliability |
| Volume | 100-101 |
| Pagination | 113334 |
| Date Published | Jan-09-2019 |
| ISSN | 00262714 |
| DOI | 10.1016/j.microrel.2019.06.026 |
| Short Title | Microelectronics Reliability |
