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Scientific Papers
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Filters: Author is G. Meneghesso [Clear All Filters]
On the origin of the leakage current in p-gate AlGaN/GaN HEMTs. 2018 IEEE International Reliability Physics Symposium (IRPS).
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2018. Total suppression of dynamic-ron in AlGaN/GaN-HEMTs through proton irradiation. 2017 IEEE International Electron Devices Meeting (IEDM).
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2017.