Scientific Papers

Export 1 results:
Filters: Keyword is semiconductor device testing and Author is P. Moens  [Clear All Filters]
2017
Meneghini M., Tajalli A., Moens P., Banerjee A., Stockman A., Tack M., Gerardin S., Bagatin M., Paccagnella A., Zanoni E. et al..  2017.  Total suppression of dynamic-ron in AlGaN/GaN-HEMTs through proton irradiation. 2017 IEEE International Electron Devices Meeting (IEDM).