Advanced Gate Drive Unit for junction temperature monitoring and dynamic current balancing of GaN transistors operating in parallel

TitleAdvanced Gate Drive Unit for junction temperature monitoring and dynamic current balancing of GaN transistors operating in parallel
Publication TypeConference Paper
Year of Publication2020
AuthorsMelkonyan A, Schulz M
Conference Name2020 IEEE Applied Power Electronics Conference and Exposition (APEC)2020 IEEE Applied Power Electronics Conference and Exposition (APEC)
PublisherIEEE
Conference LocationNew Orleans, LA, USA
DOI10.1109/APEC39645.202010.1109/APEC39645.2020.9124529