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Advanced Gate Drive Unit for junction temperature monitoring and dynamic current balancing of GaN transistors operating in parallel
Title | Advanced Gate Drive Unit for junction temperature monitoring and dynamic current balancing of GaN transistors operating in parallel |
Publication Type | Conference Paper |
Year of Publication | 2020 |
Authors | Melkonyan A, Schulz M |
Conference Name | 2020 IEEE Applied Power Electronics Conference and Exposition (APEC)2020 IEEE Applied Power Electronics Conference and Exposition (APEC) |
Publisher | IEEE |
Conference Location | New Orleans, LA, USA |
DOI | 10.1109/APEC39645.202010.1109/APEC39645.2020.9124529 |