A Physical-Statistical Approach to AlGaN/GaN HEMT Reliability

TitleA Physical-Statistical Approach to AlGaN/GaN HEMT Reliability
Publication TypeConference Paper
Year of Publication2019
AuthorsMoens P, Stockman A
Conference Name2019 IEEE International Reliability Physics Symposium (IRPS)2019 IEEE International Reliability Physics Symposium (IRPS)
PublisherIEEE
Conference LocationMonterey, CA, USA
DOI10.1109/IRPS.2019.8720521