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A Physical-Statistical Approach to AlGaN/GaN HEMT Reliability
Title | A Physical-Statistical Approach to AlGaN/GaN HEMT Reliability |
Publication Type | Conference Paper |
Year of Publication | 2019 |
Authors | Moens P, Stockman A |
Conference Name | 2019 IEEE International Reliability Physics Symposium (IRPS)2019 IEEE International Reliability Physics Symposium (IRPS) |
Publisher | IEEE |
Conference Location | Monterey, CA, USA |
DOI | 10.1109/IRPS.2019.8720521 |