Quantitative evaluation of strain relaxation in annealed sputter-deposited AlN film

TitleQuantitative evaluation of strain relaxation in annealed sputter-deposited AlN film
Publication TypeJournal Article
Year of Publication2019
AuthorsTanaka S, Shojiki K, Uesugi K, Hayashi Y, Miyake H
JournalJournal of Crystal Growth
Volume512
Pagination16 - 19
Date PublishedJan-04-2019
ISSN00220248
DOI10.1016/j.jcrysgro.2019.02.001
Short TitleJournal of Crystal Growth